SEM / TEM / EPMA Image Contest - JEOL USA
Take Your Best Shot! JEOL SEM, TEM and EPMA users, you are the experts in your field of research and analysis. We're proud to be able to showcase your images and to award a prize each month, with a Grand Prize winner at the end of the year. 2023 Grand Prize SEM Winner.
Scanning Electron Microscope (SEM) | Products | JEOL Ltd.
Scanning electron microscopes (SEM) and its abundant attachments for surface observation and analysis are one of the most active instruments at the R&D institutes and quality test sites in the world. JEOL can offer a wide range of lineups from general purpose scanning electron microscopes (W-SEM) including a benchtop type that allows operations ...
Scanning Electron Microscope | SEM - JEOL USA
JEOL introduced its first Scanning Electron Microscope (SEM) in the early 1960s. Since then, JEOL innovations in resolution and SEM functionality have enabled microscopists to image and characterize a new generation of nanomaterials, reveal intricate biological details, analyze forensic evidence, and perform failure analysis and quality control.
What is Scanning Electron Microscopy? - JEOL USA
SEMs produce images by directing a high-energy beam of electrons onto a sample and scanning it in a zig-zag pattern (raster scanning). This requires a suite of interconnected optical components, including condenser and objective lenses to focus the beam, and deflector coils to alter the beam’s path.
The Scanning Electron Microscope (SEM) is used for observation of specimen surfaces. When the specimen is irradiated with a fine electron beam (called an electron probe), secondary electrons are emitted from the specimen surface.
JCM-7000NeoScope™ Benchtop SEM | Products | JEOL Ltd.
The new high-sensitivity 4-segmented backscattered electron detector enables 2-pane viewing of a SEM image and a 3D image using Live 3D function. In addition to instantaneous shape determination for samples with complex topographies, depth information can also be acquired.
Scanning Electron Microscopes (SEM) - JEOL
With JEOL electron microscopes it is possible to image and three-dimensionally reconstruct not only the smallest of biological structures such as viruses, but also microscale objects such as synapses or cells.
observation of a high-magnification SEM image. With our Analytical series, seamless transition is made from high magnification SEM imaging to elemental analysis.
JCM-7000 - JEOL (Germany) GmbH and Nordic (AB)
“Live 3D”: real-time SEM image and reconstructed 3D surface for simultaneous acquisition of topographic depth information and surface fine structures. Full-featured electron optics for magnifications up to x100,000.
JSM-IT210 InTouchScope™ - JEOL (Germany) GmbH and Nordic (AB)
Zeromag-mode for intuitive transition from light-optic to SEM image. chemical analysis with integrated JEOL EDS and live analysis / mapping. fast sample navigation at 5x – 300,000x magnifications. Smile View Premium with image sharpening, montaging, position alignment and …