It is very important to note that the Hitachi FB-2000A FIB is a single beam FIB; therefore, the ion beam is the source of sputtering and secondary electrons used for imaging. This is a drawback to ...

When all you’ve got is a hammer, everything looks like a nail. And when you’ve got a scanning electron microscope, everything must look like a sample that would be really, really interesting ...

In electronics work, the scanning electron microscope (SEM) is the most common. You hit something with electrons and watch for secondary electron emissions. However, biologists more often use a ...

An electron multiplier is a device used in many scientific instruments to detect and amplify signals. It operates on the principle of secondary emission, where the impact of an energetic particle (in ...

The electron beam follows a vertical path through the microscope ... Detectors collect these X-rays, backscattered electrons, and secondary electrons and convert them into a signal that is sent to a ...

It uses a scanning electron microscope equipped with a focused gallium ion beam to sequentially mill away the sample surface. In-column backscattered (EsB) and secondary electron (SE) detectors are ...

The JEOL JSM-IT100 is capable of 33-300,000X magnification with 4nm resolution. It is equipped with a secondary electron detector, backscatter electron detector, low vacuum secondary detector and ...

Electron beam (eBeam) technology, long utilized for specialized manufacturing processes, has evolved significantly over the ...

If there’s one thing developers agree on about cross-platform applications, it’s that it’s easier to create a GUI with HTML, CSS, and JavaScript than to use one of the many cross-platform ...

The Ultra Plus scanning electron microscope is suitable for high-resolution imaging of biological and non-biological specimens. The microscope's charge compensation system allows non-conducting ...